Authors   Xulei Wu1,2, Bingjie Dang2, Hong Wang5, Xiulong Wu1,*, and Yuchao Yang2,3,4,* 1School of Electronics and Information Engineering, Anhui University, Hefei 230601, China. 2Key Laboratory of Microelectronic Devices and Circuits (MOE), School of Integrated Circuits, Peking University, Beijing 100871, China.