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A bipolar junction transistor EMC modeling method based on physical characteristic measurement and simplex optimization
  • +3
  • Zeyu Pan,
  • Yu Zhang,
  • Dan Ren,
  • Jinsheng Yang,
  • Bao-Lin Nie,
  • Pingan Du
Zeyu Pan
University of Electronic Science and Technology of China School of Mechanical and Electrical Engineering
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Yu Zhang
University of Electronic Science and Technology of China School of Mechanical and Electrical Engineering
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Dan Ren
China Academy of Engineering Physics Institute of Electronic Engineering
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Jinsheng Yang
University of Electronic Science and Technology of China School of Mechanical and Electrical Engineering
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Bao-Lin Nie
University of Electronic Science and Technology of China School of Mechanical and Electrical Engineering
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Pingan Du
University of Electronic Science and Technology of China School of Mechanical and Electrical Engineering

Corresponding Author:dupingan@uestc.edu.cn

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Abstract

Bipolar junction transistors (BJTs) are widely used in various electronic systems, and the establishment of the electromagnetic compatibility (EMC) model for BJTs is crucial for EMC analysis of these systems, such as high-frequency circuits. In this paper, a BJT EMC model that satisfies both functionality and EMC analysis requirements was established based on physical characteristic measurement. Firstly, comprehensive and systematic methods for measurement and extracting SPICE parameters based on physical BJTs are presented, including a proposed curve-fitting calculation method for extracting barrier capacitance parameters. Secondly, an analysis of the impact of major BJT electrical characteristics parameters was conducted, leading to the identification of important model parameters affecting BJT functionality and EMC. Finally, the primary BJT model was optimized using the simplex method, and a method for EMC analysis and verification of the BJT model was presented. The experimental and simulation results are in good agreement, and the established model meets the accuracy requirements for both EMC and functionality. Therefore, the proposed method is feasible and suitable for the EMC modeling of BJTs.
08 May 2023Submitted to International Journal of Circuit Theory and Applications
08 May 2023Submission Checks Completed
08 May 2023Assigned to Editor
08 May 2023Review(s) Completed, Editorial Evaluation Pending
08 May 2023Reviewer(s) Assigned
15 Jun 2023Editorial Decision: Revise Minor
08 Jul 20231st Revision Received
12 Jul 2023Submission Checks Completed
12 Jul 2023Assigned to Editor
12 Jul 2023Review(s) Completed, Editorial Evaluation Pending
12 Jul 2023Reviewer(s) Assigned
20 Aug 2023Editorial Decision: Accept