AUTHOREA
Log in
Sign Up
Browse Preprints
LOG IN
SIGN UP
SUFIA SHAHIN
Guest Scientist
Germany
Public Documents
1
March 08, 2025
CFET Beyond 3 nm: SRAM Reliability under Design-Time and Run-Time Variability
Sufia Shahin, Swati Deshwal, Anriban Kar, et al.
