2.3 Catalyst characterization and plasma diagnostics
The detailed characterization procedures of X-ray diffraction (XRD),
N2 physisorption, X-ray fluorescence (XRF),
H2-temperature-programmed reduction
(H2-TPR), UV-Visible spectrophotometry (UV-Vis), X-ray
photoelectron spectroscopy (XPS), scanning electron microscopy (SEM),
high resolution transmission electron microscopy (HRTEM), In-situoptical emission spectroscopy (OES), and the digital oscilloscope
measurements are shown in the SI, section 4.