2.3 Catalyst characterization and plasma diagnostics
The detailed characterization procedures of X-ray diffraction (XRD), N2 physisorption, X-ray fluorescence (XRF), H2-temperature-programmed reduction (H2-TPR), UV-Visible spectrophotometry (UV-Vis), X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), high resolution transmission electron microscopy (HRTEM), In-situoptical emission spectroscopy (OES), and the digital oscilloscope measurements are shown in the SI, section 4.