2.3 Characterization
X-ray Diffraction measurement of the obtained samples was carried out by
an advanced diffractometer operating (HORIBA Scientific, France; 40 kV
and 30 mA ). SEM (Zeiss evo10) were used to obtain the morphology
information about the samples. TEM: FEI Tecnai TF20 high-resolution
transmission electron microscope. XPS testing was performed on an energy
dispersive X-ray instrument (ESCALAB 250Xi) using energy dispersive
X-ray analysis. UV-vis diffuse reflectance spectra were tested on a
PerkinElmer Lambda-750 UV-vis-near-IRvia spectrometer using
BaSO4 as a reference for baseline correction. The
N2 adsorption-desorption isotherm of the sample was
obtained at 77K using ASAP2020M. The PL spectrum were acquired by a
FLUOROMAX-4 spectrophotometer at room temperature.
Na2SO4 (0.2 M) aqueous solution was used
as supporting electrolyte. In a standard three-electrode cell, the
photoelectrochemical measurement was performed on an electrochemical
analyzer (VersaStat4-400, Advanced measurement Technology, Inc).