2.3 Characterization
The as-prepared material was characterized by X-ray diffraction (XRD, PANalytical) and scanning electron microscope (SEM, FEI Quanta430 microscope) to identify the structure and morphology. The pore structure was measured by N2 isothermal adsorption/desorption. The distribution of size and wettability for the as-prepared material were measured by dynamiclightscattering (DLS) (Marlven Nano-ZS, England) and video contact angle analyzer (Dataphysics OCA25, German). The parameters for XRD measurement and the methods for the analysis of pore structure were shown in the supporting information (Text S1 ).