2.3 Characterization
The as-prepared material was characterized by X-ray diffraction (XRD,
PANalytical) and scanning electron microscope (SEM, FEI Quanta430
microscope) to identify the structure and morphology. The pore structure
was measured by N2 isothermal adsorption/desorption. The
distribution of size and wettability for the as-prepared material were
measured by
dynamiclightscattering
(DLS) (Marlven Nano-ZS, England) and video contact angle analyzer
(Dataphysics OCA25, German). The parameters for XRD measurement and the
methods for the analysis of pore structure were shown in the supporting
information (Text S1 ).