SAKCL: A Deep Neural Network Test Data Selection Method Based on
Self-Attention and K-Means Clustering
Abstract
Deep neural networks (DNNs) inevitably have defects like traditional
software. When the defective DNN model is applied to safety-critical
fields, it may lead to serious accidents. Therefore, how to effectively
detect defective DNN models has become an urgent problem to be solved.
Maintaining a high-quality test data set is an important guarantee for
achieving the above goals for DNN models testing. In order to further
improve the accuracy and diversity of test data that can detect model
defects, thereby improving the efficiency of detecting DNN defects, a
test data selection method based on self-attention mechanism and K-means
clustering (SAKCL) is proposed in this paper. Experiments were conducted
on the combination of five deep learning data sets and models. The
results show that SAKCL is significantly better than the existing
methods, whether it is the ratio of test cases that can detect model
defects in the selected samples or the diversity of model defect types
that test cases can detect.