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Analysis of Etched drain based Cyl GAA TFET based SRAM cell Design
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  • ANKUR BEOHAR,
  • Darshan Sarode,
  • Ribu Mathew,
  • Abhishek kumar Upadhyay
ANKUR BEOHAR
VIT Bhopal University

Corresponding Author:ankurbeohar16@gmail.com

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Darshan Sarode
VIT Bhopal University
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Ribu Mathew
VIT Bhopal University
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Abhishek kumar Upadhyay
XFAB GmbH
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Abstract

This paper aims to propose a novel method for designing an SRAM cell using an Etched Drain based Cyl. GAA TFET with a hetero-substrate material and an elevated density strip. The aim is to reduce power dissipation and improve stability, as demonstrated through analysis utilizing SNM as well as N-Curve methods. With respect to the 16nm MOSFET based SRAM cell, the proposed device-based SRAM cell shows significant improvements with a 68.305% reduction in leakage power, a 15.58% increase in SVNM, an 8.623% increase in SINM, an 8.152% increase in WTV, a 12.86% increase in WTI, a 27.62% increase in SPNM, and a 19.95% increase in WTP. The design is implemented and analyzed using Cadence Virtuoso software, and a novel approach of look up tables and Verilog A is utilized for the device to circuit application. These results indicate promising advancements in the design of SRAM cells, which could have significant implications for the development of advanced computer systems.
21 Jun 2023Submitted to International Journal of Numerical Modelling: Electronic Networks, Devices and Fields
21 Jun 2023Submission Checks Completed
21 Jun 2023Assigned to Editor
21 Jun 2023Review(s) Completed, Editorial Evaluation Pending
22 Oct 2023Reviewer(s) Assigned
30 Apr 20241st Revision Received
19 Jun 2024Review(s) Completed, Editorial Evaluation Pending
27 Aug 2024Reviewer(s) Assigned
05 Sep 2024Editorial Decision: Accept